Joint Test Action Group

Results: 911



#Item
241Electronics / Boundary scan / Joint Test Action Group / Automatic test pattern generation / Berkeley Software Distribution / NetApp / Netlist / Boundary scan description language / Electronics manufacturing / Electronic engineering / Manufacturing

onTAP Test Types Application Note Testing for the IEEEand IEEEJTAG / Boundary Scan Standard onTAP ATPG - Test-to-Print onTAP’s ATPG reads CAD netlists and BSDL files to generate test programs that veri

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Source URL: www.flynn.com

Language: English - Date: 2015-03-12 12:56:49
242Embedded systems / Computer buses / Electronics manufacturing / Joint Test Action Group / RS-232 / PC/104 / Serial port / Analog Devices / Universal Serial Bus / Computer hardware / Electronics / Computing

Danville Signal Processing, Inc. dspstak™ Family User Manual Version 2.00

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Source URL: www.danvillesignal.com

Language: English - Date: 2012-10-12 11:21:30
243Computer memory / Field-programmable gate array / MicroBlaze / Xilinx / CPU cache / Multi-core processor / Dynamic random-access memory / Joint Test Action Group / NetFPGA / Computer hardware / Computing / Electronic engineering

Formic: Cost-efficient and Scalable Prototyping of Manycore Architectures Spyros Lyberis, George Kalokerinos, Michalis Lygerakis, Vassilis Papaefstathiou, Dimitris Tsaliagkos, Manolis Katevenis, Dionisios Pnevmatikatos a

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Source URL: www.ics.forth.gr

Language: English - Date: 2013-12-23 07:16:59
244Fabless semiconductor companies / Cryptography / Actel / Backdoor / Microsemi / Field-programmable gate array / Joint Test Action Group / Power analysis / Advanced Encryption Standard / Espionage / Electronic engineering / Electronics

Researchers’ response: Microsemi: Security claims with respect to ProASIC3 May 31, 2012 It was not our intention to make public disclosure at this time as the final paper “Breakthrough silicon scanning discovers back

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Source URL: www.cl.cam.ac.uk

Language: English - Date: 2012-06-01 10:28:42
245Integrated circuits / Siemens / Secure Digital / Serial Peripheral Interface Bus / I²C / Joint Test Action Group / Booting / Universal Serial Bus / OLPC XO-1 / Computer hardware / Electronics / Computing

Multiplexed Interfaces Power 3.3_N 3.3_N 3.3_N

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Source URL: wiki.laptop.org

Language: English - Date: 2012-09-23 23:10:32
246Integrated circuits / Automatic test pattern generation / Electronics manufacturing / Electronic design / Test compression / Scan chain / Iddq testing / Joint Test Action Group / Synopsys / Electronic engineering / Electronics / Electronic design automation

Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview

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Source URL: www.synopsys.com

Language: English - Date: 2015-02-18 14:15:52
247Electronics / Embedded systems / Mobile computers / Pinout / OLPC XO-1 / Joint Test Action Group / Classes of computers / Technology / One Laptop per Child

Connectors OLPC XO 1.75 Laptop Serial Interfaces CN8, CN14

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Source URL: wiki.laptop.org

Language: English - Date: 2012-02-17 22:46:36
248Electronics / Joint Test Action Group / Boundary scan / Printed circuit board / Design for testing / Signal integrity / Ground / Automatic test equipment / In-circuit test / Electronics manufacturing / Manufacturing / Electromagnetism

FEATURE FEATURE SIGNAL INTEGRITY IN TEST FIXTURES continues It is important to realise that this doesn’t

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Source URL: www.xjtag.com

Language: English - Date: 2014-05-06 06:30:55
249Electronics / PCI eXtensions for Instrumentation / Joint Test Action Group / CompactPCI / National Instruments / LabVIEW / Conventional PCI / M-Module / Automatic test equipment / Computer buses / Computing / Computer hardware

www.xjtag.com PXI XJLink2 Overview

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Source URL: www.xjtag.com

Language: English - Date: 2013-06-14 07:52:44
250Electronics / Universal Serial Bus / USB flash drive / Universal asynchronous receiver/transmitter / Serial port / Host controller interface / Device file / SheevaPlug / Joint Test Action Group / Computer hardware / USB / Computing

Usb serial design and experience in Plan 9 Gorka Guardiola Múzquiz Francisco J Ballesteros Enrique Soriano Salvador Laboratorio de Sistemas Universidad Rey Juan Carlos

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Source URL: lsub.org

Language: English - Date: 2014-05-08 10:53:34
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